Minutes, IBIS Quality Committee

27 April 2010

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lijun, Huawei
  Lynne Green, Green Streak Programs
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Muniswarareddy Vorugu, ARM Ltd
  Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Tim Coyle, Signal Consulting Group
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for opens and IBIS related patent disclosures:

- No one declared a patent.

- Eckhard European IBIS summit in 2 week
  - We will have no IQ meeting May 11

AR Review:

- none

New items:

Discussion of Colin Warwick proposal for public IBIS model reviews:
- Lance: He is giving a place for vendors to make their models findable
- Bob: This is not an official IBIS activity
- Mike had tested the Wiki, making a small change to the page

Mike showed the IBIS Correlation outline:
- We moved the Correlation section ahead of Measurement
- We promoted all Correlation subsections to top level
- Mike: Since this references an IEEE spec we should look at that

Mike showed the draft IEEE correlation specification P1597.1
- Bob: This looks like the document we are trying to write
- Mike: We might add only IBIS-specific guidance
  - Part of this is general, but it goes into frequency domain FSV
- Bob: We usually look at low frequency deviations when we examine visually
- Mike: Section 3a uses inverse Fourier to get the DC levels

AR: Mike ask Antonio Orlandi to join us

Mike: We would want test data to work with

AR: Moshiul find reference and test data sets for some example model

Moshiul: We could get a FOM for IBIS I/V tables against measured I/V

Mike: Should we compare IBIS simulation results against a reference?
- Bob: We could compare IBIS and HSPICE simulations with a test load circuit

Bob: We could ask Orlandi to help analyze it

Next meeting will be May 13

Meeting ended at 12:14 PM Eastern Time.